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"Random testing of LSI self-checking circuits."

Hugues Deneux, Pascale Thévenod-Fosse (1984)

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DOI: 10.1007/978-3-642-69698-5_31

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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  dblp key:
  - conf/icftcs/DeneuxT84
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  - https://dblp.org/rec/conf/icftcs/DeneuxT84
Hugues Deneux, Pascale Thévenod-Fosse:
Random testing of LSI self-checking circuits. Fehlertolerierende Rechensysteme 1984: 380-390

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