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"IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits."

Ali Chehab et al. (2002)

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DOI: 10.1109/DELTA.2002.994659

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/delta/ChehabMSW02
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  persistent URL:
  - https://dblp.org/rec/conf/delta/ChehabMSW02
Ali Chehab, Rafic Z. Makki, Michael Spica, David Wu:
IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits. DELTA 2002: 403-407

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