default search action

combined dblp search
author search
venue search
publication search

ask others

"Capture in Turn Scan for Reduction of Test Data Volume, Test Application ..."

Zhiqiang You et al. (2010)

> Home

Details and statistics

DOI: 10.1109/ATS.2010.70

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/ats/YouHIKF10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/YouHIKF10
Zhiqiang You, Jiedi Huang, Michiko Inoue, Jishun Kuang, Hideo Fujiwara:
Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power. Asian Test Symposium 2010: 371-374

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.