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"Achieving High Test Quality with Reduced Pin Count Testing."

Jay Jahangiri et al. (2005)

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DOI: 10.1109/ATS.2005.19

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - conf/ats/JahangiriMCMP05
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  - https://dblp.org/rec/conf/ats/JahangiriMCMP05
Jay Jahangiri, Nilanjan Mukherjee, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press:
Achieving High Test Quality with Reduced Pin Count Testing. Asian Test Symposium 2005: 312-317

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