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Miquel Vellvehí
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2020 – today
- 2023
- [j22]Conrad Ferrer
, Oriol Avino-Salvado
Die-Level Transient Thermal Imaging Based on Fourier Series Reconstruction for Power Industrial Electronics. IEEE Trans. Instrum. Meas. 72: 1-11 (2023) - 2021
- [j21]Miquel Vellvehí
Local Thermal Resistance Extraction in Monolithic Microwave Integrated Circuits. IEEE Trans. Ind. Electron. 68(12): 12840-12849 (2021)
2010 – 2019
- 2019
- [j20]Manuel Fernandez
Solid-State Relay Solutions for Induction Cooking Applications Based on Advanced Power Semiconductor Devices. IEEE Trans. Ind. Electron. 66(3): 1832-1841 (2019) - [j19]Xavier Perpiñà
Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging. IEEE Trans. Instrum. Meas. 68(8): 2861-2870 (2019) - 2017
- [j18]Manuel Fernandez, Xavier Perpiñà, Jaume Roig-Guitart, Miquel Vellvehí
Short-Circuit Study in Medium-Voltage GaN Cascodes, p-GaN HEMTs, and GaN MISHEMTs. IEEE Trans. Ind. Electron. 64(11): 9012-9022 (2017) - 2015
- [j17]Xavier Jordà
Characterization of phase change material systems using a thermal test device. Microelectron. J. 46(12): 1195-1201 (2015) - [j16]Mihaela Alexandru, Viorel Banu
SiC Integrated Circuit Control Electronics for High-Temperature Operation. IEEE Trans. Ind. Electron. 62(5): 3182-3191 (2015) - [j15]Javier Leon, Xavier Perpiñà
Functional and Consumption Analysis of Integrated Circuits Supplied by Inductive Power Transfer by Powering Modulation and Lock-In Infrared Imaging. IEEE Trans. Ind. Electron. 62(12): 7774-7785 (2015) - 2014
- [j14]Josep Altet
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. Microelectron. J. 45(5): 484-490 (2014) - [j13]Xavier Perpiñà
Comparison of temperature limits for Trench silicon IGBT technologies for medium power applications. Microelectron. Reliab. 54(9-10): 1839-1844 (2014) - [j12]Javier Leon, Xavier Perpiñà
Temperature effects on the ruggedness of SiC Schottky diodes under surge current. Microelectron. Reliab. 54(9-10): 2207-2212 (2014) - [c6]Javier Leon, Xavier Perpiñà
Study of surface weak spots on SiC Schottky Diodes under specific operating regimes by Infrared Lock-in sensing. ESSDERC 2014: 385-388 - [c5]Josep Altet
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. MWSCAS 2014: 1081-1084 - 2013
- [j11]Jiri Jakovenko
Design methodologies for reliability of SSL LED boards. Microelectron. Reliab. 53(8): 1076-1083 (2013) - [j10]B. Pardo, A. Gasse, A. Fargeix, Jiri Jakovenko
Thermal resistance investigations on new leadframe-based LED packages and boards. Microelectron. Reliab. 53(8): 1084-1094 (2013) - [c4]Viorel Banu
High temperature-low temperature coefficient analog voltage reference integrated circuit implemented with SiC MESFETs. ESSCIRC 2013: 427-430 - [c3]Mihaela Alexandru, Viorel Banu
4H-SiC MESFET specially designed and fabricated for high temperature integrated circuits. ESSDERC 2013: 103-106 - 2012
- [j9]Xavier Perpiñà
Design for reliability of solid state lighting systems. Microelectron. Reliab. 52(9-10): 2294-2300 (2012) - [j8]Luis A. Navarro, Xavier Perpiñà
Thermal cycling analysis of high temperature die-attach materials. Microelectron. Reliab. 52(9-10): 2314-2320 (2012) - [c2]Josep Altet
DC temperature measurements for power gain monitoring in RF power amplifiers. ITC 2012: 1-8 - 2011
- [j7]Philippe Godignon
SiC Schottky Diodes for Harsh Environment Space Applications. IEEE Trans. Ind. Electron. 58(7): 2582-2590 (2011) - [j6]Xavier Perpiñà
Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based Systems. IEEE Trans. Ind. Electron. 58(7): 2662-2672 (2011)
2000 – 2009
- 2007
- [j5]Miquel Vellvehí
Coupled electro-thermal simulation of a DC/DC converter. Microelectron. Reliab. 47(12): 2114-2121 (2007) - 2004
- [j4]Miquel Vellvehí
Design considerations for 6.5 kV IGBT devices. Microelectron. J. 35(3): 269-275 (2004) - [j3]Amador Pérez-Tomás
IGBT gate driver IC with full-bridge output stage using a modified standard CMOS process. Microelectron. J. 35(8): 659-666 (2004) - [j2]Xavier Perpiñà
Self-heating experimental study of 600V PT-IGBTs under low dissipation energies. Microelectron. J. 35(10): 841-847 (2004) - 2002
- [j1]Jaume Roig, David Flores
Reduction of self-heating effect on SOIM devices. Microelectron. Reliab. 42(1): 61-66 (2002) - 2001
- [c1]José Luis Merino, Sebastià A. Bota, A. Herms, Josep Samitier, Enric Cabruja
Smart Temperature Sensor for On-Line Monitoring in Automotive Applications. IOLTW 2001: 122-126
Coauthor Index
aka: Xavier Perpiñà
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