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Kazutoshi Shiba

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2010 – 2019

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2014
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Yoshisato Yokoyama, Yuichiro Ishii, Koji Tanaka, Tatsuya Fukuda, Yoshiki Tsujihashi, Atsushi Miyanishi, Shinobu Asayama, Keiichi Maekawa, Kazutoshi Shiba, Koji Nii:
40 nm Dual-port and two-port SRAMs for automotive MCU applications under the wide temperature range of -40 to 170°C with test screening against write disturb issues. A-SSCC 2014: 25-28
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Yoshisato Yokoyama, Yuichiro Ishii, Hidemitsu Kojima, Atsushi Miyanishi, Yoshiki Tsujihashi, Shinobu Asayama, Kazutoshi Shiba, Koji Tanaka, Tatsuya Fukuda, Koji Nii, Kazumasa Yanagisawa:
40nm Ultra-low leakage SRAM at 170 deg.C operation for embedded flash MCU. ISQED 2014: 24-31

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