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Yaqing Chi
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2020 – today
- 2022
- [c6]Chang Cai, Zehao Wu, Jing Zhang, Luchang Ding, Lei Shen, Jun Yu, Yaqing Chi:
Implementation of Radiation Hardened Flip-Flops Based on Novel Fishbone Layouts. ISCAS 2022: 2286-2289 - 2021
- [j11]Jingtian Liu, Bin Liang, Jianjun Chen, Yaqing Chi, Li Yan, Yang Guo:
Current mirror with charge dissipation transistor for analogue single-event transient mitigation in space application. IET Circuits Devices Syst. 15(2): 136-140 (2021) - 2020
- [j10]Ruiqiang Song
, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen:
MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology. IEICE Electron. Express 17(4): 20190708 (2020) - [j9]Qian Chen, Jianwei Han, Yingqi Ma, Sai Li, Jingtian Liu, Yaqing Chi, Bin Liang:
Research on the influences of well structure on dose rate effects in 65nm CMOS circuit. IEICE Electron. Express 17(14): 20200205 (2020) - [j8]Anquan Wu
Investigation of Heavy-Ion Induced Single-Event Transient in 28 nm Bulk Inverter Chain. Symmetry 12(4): 624 (2020)
2010 – 2019
- 2019
- [j7]Hengzhou Yuan
28nm Fault-Tolerant Hardening-by-Design Frequency Divider for Reducing Soft Errors in Clock and Data Recovery. IEEE Access 7: 47955-47961 (2019) - [j6]Ruiqiang Song
Characterization of P-hit and N-hit single-event transient using heavy ion microbeam. IEICE Electron. Express 16(8): 20190141 (2019) - [j5]Jingyan Xu
Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs. Symmetry 11(6): 793 (2019) - [c5]Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen:
A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area. ASICON 2019: 1-4 - 2017
- [j4]Bin Liang, Ruiqiang Song
Comparison of single-event upset generated by heavy ion and pulsed laser. Sci. China Inf. Sci. 60(7): 072401:1-072401:9 (2017) - [j3]Ruiqiang Song
Modeling the impact of process and operation variations on the soft error rate of digital circuits. Sci. China Inf. Sci. 60(12): 129402 (2017) - [c4]Hongbing Tan, Haiyan Chen, Sheng Liu, Xikun Ma, Yaqing Chi:
A Programmable Pre-emphasis Transmitter for SerDes in 40 nm CMOS. NCCET 2017: 35-44 - 2014
- [j2]Chao Zhang, Jianjun Chen, Yaqing Chi, Hui Yang:
Research on single-event transient mechanism in a novel SOI CMOS technology. IEICE Electron. Express 11(18): 20140518 (2014) - [c3]Honghui Sun, Liang Fang, Yao Wang, Yaqing Chi, Rulin Liu:
A low contact resistance graphene field effect transistor with single-layer-channel and multi-layer-contact. NANOARCH 2014: 139-144 - 2013
- [c2]Yaqing Chi, Yibai He, Bin Liang, Chunmei Hu:
A Scan Chain Based SEU Test Method for Microprocessors. NCCET 2013: 180-185 - 2010
- [j1]Bingcai Sui, Liang Fang, Yaqing Chi, Chao Zhang:
Analysis of negative differential conductance of single-island single-electron transistors owing to Coulomb oscillations. IET Circuits Devices Syst. 4(5): 425-432 (2010) - [c1]Bingcai Sui, Liang Fang, Yaqing Chi:
Reconfigurable logic gate implemented by suspended-gate single-electron transistors. NEMS 2010: 26-29
Coauthor Index
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