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Clemens J. M. Lasance

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2010 – 2019

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2010
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Vladimír Székely, Clemens J. M. Lasance:
Editorial. Microelectron. J. 41(9): 539 (2010)

2000 – 2009

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2003
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Yogendra Joshi, Kaveh Azar, David L. Blackburn, Clemens J. M. Lasance, Ravi Mahajan, Jukka Rantala:
How well can we assess thermally driven reliability issues in electronic systems today? Summary of panel held at the Therminic 2002. Microelectron. J. 34(12): 1195-1201 (2003)
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Clemens J. M. Lasance:
Thermally driven reliability issues in microelectronic systems: status-quo and challenges. Microelectron. Reliab. 43(12): 1969-1974 (2003)

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