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David Gauthier
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2020 – today
- 2021
- [c10]Chaojie Zhang, Alok Gautam Kumbhare, Ioannis Manousakis, Deli Zhang, Pulkit A. Misra, Rod Assis, Kyle Woolcock, Nithish Mahalingam, Brijesh Warrier, David Gauthier, Lalu Kunnath, Steve Solomon, Osvaldo Morales, Marcus Fontoura, Ricardo Bianchini:
Flex: High-Availability Datacenters With Zero Reserved Power. ISCA 2021: 319-332
2010 – 2019
- 2015
- [j3]Abhishek Biswas
, David Gauthier, Desh Ranjan, Mohammad Zubair:
ISQuest: finding insertion sequences in prokaryotic sequence fragment data. Bioinform. 31(21): 3406-3412 (2015) - [c9]Jakob Bak, William Verplank, David Gauthier:
Motors, Music and Motion. TEI 2015: 367-374 - 2014
- [c8]Abhishek Biswas
Big data challenges for estimating genome assembler quality. BCB 2014: 653-660 - [c7]Sriram Sankar, David Gauthier, Sudhanva Gurumurthi:
Power availability provisioning in large data centers. Conf. Computing Frontiers 2014: 21:1-21:9 - 2013
- [c6]Bill Verplank, David Gauthier, Jakob Bak:
TEI 2013 studio: motors and music. TEI 2013: 431-434 - 2012
- [c5]Sylvain Clerc, Fady Abouzeid
A 65nm SRAM achieving 250mV retention and 350mV, 1MHz, 55fJ/bit access energy, with bit-interleaved radiation Soft Error tolerance. ESSCIRC 2012: 313-316 - [c4]Sylvain Clerc, Fady Abouzeid
A 0.32V, 55fJ per bit access energy, CMOS 65nm bit-interleaved SRAM with radiation Soft Error tolerance. ICICDT 2012: 1-4
2000 – 2009
- 2007
- [c3]Doug Van Nort, David Gauthier, Sha Xin Wei, Marcelo M. Wanderley:
Extraction of gestural Meaning from a Fabric-Based Instrument. ICMC 2007 - 2006
- [c2]Amitava Biswas, Tom Donaldson, Jagmit Singh, Sara Diamond, David Gauthier, Michael Longford:
Assessment of mobile experience engine, the development toolkit for context aware mobile applications. Advances in Computer Entertainment Technology 2006: 8
1990 – 1999
- 1995
- [j2]Kenong Wu, David Gauthier, Martin D. Levine:
Live cell image segmentation. IEEE Trans. Biomed. Eng. 42(1): 1-12 (1995) - 1994
- [c1]Gregory W. Papadeas, David Gauthier:
An On-Line Data Collection and Analysis System for VLSI Devices at Wafer Probe and Final Test. ITC 1994: 771-780
1980 – 1989
- 1989
- [p1]David Gauthier, Martin D. Levine, Alfred S. Malowany, N. Begnoche, G. Lefebvre:
Measuring the Alignment accuracy of Surface Mount assembly Circuit Board masks. Computer Vision and Shape Recognition 1989: 1-20 - 1987
- [j1]David Gauthier, Paul Freedman, Gregory Carayannis, Alfred S. Malowany:
Interprocess communication for distributed robotics. IEEE J. Robotics Autom. 3(6): 493-504 (1987)
Coauthor Index
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