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Roel Gronheid

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2010 – 2019

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2012
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Pavel Poliakov, Pieter Blomme, Alessandro Vaglio Pret, Miguel Corbalan Miranda, Roel Gronheid, Diederik Verkest, Jan Van Houdt, Wim Dehaene:
Trades-off between lithography line edge roughness and error-correcting codes requirements for NAND Flash memories. Microelectron. Reliab. 52(3): 525-529 (2012)

2000 – 2009

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2009
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Kurt Ronse, Philippe Jansen, Roel Gronheid, Eric Hendrickx, Mireille Maenhoudt, Vincent Wiaux, Mieke Goethals, R. Jonckheere, Geert Vandenberghe:
Lithography Options for the 32 nm Half Pitch Node and Beyond. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(8): 1884-1891 (2009)
2008
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Kurt Ronse, Philippe Jansen, Roel Gronheid, Eric Hendrickx, Mireille Maenhoudt, Mieke Goethals, Geert Vandenberghe:
Lithography options for the 32nm half pitch node and beyond. CICC 2008: 371-378

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