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Ke Huang 0001
Person information
- affiliation: San Diego State University, Department of Electrical and Computer Engineering, CA, USA
- affiliation (2012 - 2014): University of Texas at Dallas, Richardson, TX, USA
- affiliation (PhD 2011): University of Grenoble, France
- affiliation (former): Joseph Fourier University, Grenoble I University, Grenoble, France,
Other persons with the same name
- Ke Huang — disambiguation page
- Ke Huang 0002
— University of Electronic Science and Technology of China, School of Computer Science and Engineering, Chengdu, China (and 1 more)
- Ke Huang 0003 — Tsinghua University, Institute of Microelectronics, Beijing, China (and 1 more)
- Ke Huang 0004 — University of Massachusetts, Department of Computer Science, Lowell, USA
- Ke Huang 0005 — Google, Inc., Mountain View, CA, USA (and 3 more)
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2020 – today
- 2024
- [j16]Ke Huang
Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond. IEEE Des. Test 41(2): 15-22 (2024) - [j15]Xinqiao Zhang
Scalable Binary Neural Network Applications in Oblivious Inference. ACM Trans. Embed. Comput. Syst. 23(3): 45:1-45:18 (2024) - [j14]Paarth Neekhara, Shehzeen Hussain, Xinqiao Zhang, Ke Huang, Julian J. McAuley, Farinaz Koushanfar:
FaceSigns: Semi-fragile Watermarks for Media Authentication. ACM Trans. Multim. Comput. Commun. Appl. 20(11): 337:1-337:21 (2024) - [c26]Ke Huang, Xinqiao Zhang, Farinaz Koushanfar:
Unveiling Analog Aging Trojans (ATs): Vulnerabilities and Detection Strategies. MWSCAS 2024: 678-682 - 2023
- [j13]Huili Chen
AdaTest: Reinforcement Learning and Adaptive Sampling for On-chip Hardware Trojan Detection. ACM Trans. Embed. Comput. Syst. 22(2): 37:1-37:23 (2023) - [c25]Zahra Ghodsi, Mojan Javaheripi, Nojan Sheybani, Xinqiao Zhang
zPROBE: Zero Peek Robustness Checks for Federated Learning. ICCV 2023: 4837-4847 - 2022
- [j12]Dongning Ma
DEVoT: Dynamic Delay Modeling of Functional Units Under Voltage and Temperature Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(4): 827-839 (2022) - [i5]Paarth Neekhara, Shehzeen Hussain, Xinqiao Zhang, Ke Huang, Julian J. McAuley
FaceSigns: Semi-Fragile Neural Watermarks for Media Authentication and Countering Deepfakes. CoRR abs/2204.01960 (2022) - [i4]Xinqiao Zhang, Huili Chen, Ke Huang, Farinaz Koushanfar:
An Adaptive Black-box Backdoor Detection Method for Deep Neural Networks. CoRR abs/2204.04329 (2022) - [i3]Huili Chen, Xinqiao Zhang, Ke Huang, Farinaz Koushanfar:
AdaTest: Reinforcement Learning and Adaptive Sampling for On-chip Hardware Trojan Detection. CoRR abs/2204.06117 (2022) - [i2]Zahra Ghodsi, Mojan Javaheripi, Nojan Sheybani, Xinqiao Zhang, Ke Huang, Farinaz Koushanfar:
zPROBE: Zero Peek Robustness Checks for Federated Learning. CoRR abs/2206.12100 (2022) - 2021
- [j11]Xianfeng Terry Yang
Eco-Driving System for Connected Automated Vehicles: Multi-Objective Trajectory Optimization. IEEE Trans. Intell. Transp. Syst. 22(12): 7837-7849 (2021) - [c24]Mohammad Samragh, Siam U. Hussain, Xinqiao Zhang
On the Application of Binary Neural Networks in Oblivious Inference. CVPR Workshops 2021: 4630-4639 - [c23]Ke Huang, Md Toufiq Hasan Anik, Xinqiao Zhang
Real-Time IC Aging Prediction via On-Chip Sensors. ISVLSI 2021: 13-18
2010 – 2019
- 2019
- [j10]Ke Huang
Real-Time Prediction for IC Aging Based on Machine Learning. IEEE Trans. Instrum. Meas. 68(12): 4756-4764 (2019) - 2018
- [j9]Ke Huang, Manuel J. Barragán:
Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing. J. Electron. Test. 34(3): 213-214 (2018) - [j8]Parth Kansara, Sharanabasavaraja Bheema Reddy, Louay Abdallah, Ke Huang
Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning. J. Electron. Test. 34(3): 337-349 (2018) - [j7]Ke Huang
Ecological Driving System for Connected/Automated Vehicles Using a Two-Stage Control Hierarchy. IEEE Trans. Intell. Transp. Syst. 19(7): 2373-2384 (2018) - [c22]Fang Lin, Ali Ahmadi, Kannan Sekar, Yan Pan, Ke Huang:
IC layout weak point effectiveness evaluation based on statistical methods. VTS 2018: 1-6 - [i1]Mohammad Ghasemzadeh, Fang Lin, Bita Darvish Rouhani, Farinaz Koushanfar, Ke Huang:
AgileNet: Lightweight Dictionary-based Few-shot Learning. CoRR abs/1805.08311 (2018) - 2017
- [j6]Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris
Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(12): 2120-2133 (2017) - 2016
- [j5]Ke Huang, Jian Wen, Jim Willmore:
Test-Suite-Based Analog/RF Test Time Reduction Using Canonical Correlation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(12): 2143-2147 (2016) - [c21]Naghmeh Karimi, Ke Huang:
Prognosis of NBTI aging using a machine learning scheme. DFT 2016: 7-10 - 2015
- [j4]Ke Huang, Nathan Kupp, Constantinos Xanthopoulos, John M. Carulli Jr., Yiorgos Makris
Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models. IEEE Des. Test 32(1): 53-60 (2015) - [j3]Ke Huang, Yu Liu, Nenad Korolija
Recycled IC Detection Based on Statistical Methods. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(6): 947-960 (2015) - [c20]Yu Liu, Georgios Volanis, Ke Huang, Yiorgos Makris
Concurrent hardware Trojan detection in wireless cryptographic ICs. ITC 2015: 1-8 - [c19]Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Ke Huang, Yiorgos Makris
A comparative study of one-shot statistical calibration methods for analog / RF ICs. ITC 2015: 1-10 - [c18]Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris
Yield prognosis for fab-to-fab product migration. VTS 2015: 1-6 - 2014
- [j2]Ujjwal Guin, Ke Huang, Daniel DiMase, John M. Carulli, Mohammad Tehranipoor, Yiorgos Makris
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain. Proc. IEEE 102(8): 1207-1228 (2014) - [c17]Yu Liu, Ke Huang, Yiorgos Makris
Hardware Trojan Detection through Golden Chip-Free Statistical Side-Channel Fingerprinting. DAC 2014: 155:1-155:6 - [c16]Ali Ahmadi, Ke Huang, Suriyaprakash Natarajan, John M. Carulli Jr., Yiorgos Makris
Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation. ITC 2014: 1-10 - [c15]Constantinos Xanthopoulos, Ke Huang, Abbas Poonawala, Amit Nahar, Bob Orr, John M. Carulli Jr., Yiorgos Makris
IC laser trimming speed-up through wafer-level spatial correlation modeling. ITC 2014: 1-7 - [c14]Amitava Majumdar, Suriya Natarajan, Stephen K. Sunter, Prashant Goteti, Ke Huang:
Innovative practices session 4C: Disruptive solutions in the non-digital world. VTS 2014: 1 - 2013
- [c13]Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests. DATE 2013: 553-558 - [c12]Ke Huang, Haralampos-G. D. Stratigopoulos, Louay Abdallah, Salvador Mir, Ahcène Bounceur:
Multivariate statistical techniques for analog parametric test metrics estimation. DTIS 2013: 6-11 - [c11]Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
On combining alternate test with spatial correlation modeling in analog/RF ICs. ETS 2013: 1-6 - [c10]Ozgur Sinanoglu
Reconciling the IC test and security dichotomy. ETS 2013: 1-6 - [c9]Ke Huang, John M. Carulli, Yiorgos Makris
Counterfeit electronics: A rising threat in the semiconductor manufacturing industry. ITC 2013: 1-4 - [c8]Ke Huang, Nathan Kupp, John M. Carulli Jr., Yiorgos Makris
Process monitoring through wafer-level spatial variation decomposition. ITC 2013: 1-10 - [c7]Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir:
Fault modeling and diagnosis for nanometric analog circuits. ITC 2013: 1-10 - 2012
- [j1]Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir, Camelia Hora, Yizi Xing, Bram Kruseman:
Diagnosis of Local Spot Defects in Analog Circuits. IEEE Trans. Instrum. Meas. 61(10): 2701-2712 (2012) - [c6]Ke Huang, John M. Carulli Jr., Yiorgos Makris
Parametric counterfeit IC detection via Support Vector Machines. DFT 2012: 7-12 - [c5]Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris
Spatial correlation modeling for probe test cost reduction in RF devices. ICCAD 2012: 23-29 - [c4]Kamel Beznia, Ahcène Bounceur, Louay Abdallah, Ke Huang, Salvador Mir, Reinhardt Euler:
Accurate estimation of analog test metrics with extreme circuits. ICECS 2012: 272-275 - [c3]Nathan Kupp, Ke Huang, John M. Carulli Jr., Yiorgos Makris
Spatial estimation of wafer measurement parameters using Gaussian process models. ITC 2012: 1-8 - 2010
- [c2]Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir:
Bayesian Fault Diagnosis of RF Circuits Using Nonparametric Density Estimation. Asian Test Symposium 2010: 295-298 - [c1]Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir:
Fault diagnosis of analog circuits based on machine learning. DATE 2010: 1761-1766
Coauthor Index
aka: John M. Carulli
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