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"Discriminative Deep Metric Learning for Face and Kinship Verification."

Jiwen Lu, Junlin Hu, Yap-Peng Tan (2017)

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DOI: 10.1109/TIP.2017.2717505

access: closed

type: Journal Article

metadata version: 2021-07-25

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Jiwen Lu, Junlin Hu, Yap-Peng Tan:
Discriminative Deep Metric Learning for Face and Kinship Verification. IEEE Trans. Image Process. 26(9): 4269-4282 (2017)

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