default search action

combined dblp search
author search
venue search
publication search

ask others

"Getting More From the Semiconductor Test: Data Mining With Defect-Cluster ..."

Melanie Po-Leen Ooi et al. (2011)

> Home

Details and statistics

DOI: 10.1109/TIM.2011.2122430

access: closed

type: Journal Article

metadata version: 2022-10-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/OoiSKDKC11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/OoiSKDKC11
Melanie Po-Leen Ooi, Eric Kwang Joo Sim, Ye Chow Kuang, Serge N. Demidenko, Lindsay Kleeman, Chris W. K. Chan:
Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction. IEEE Trans. Instrum. Meas. 60(10): 3300-3317 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.