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"A Novel Degradation Modeling and Prognostic Framework for Closed-Loop ..."

Xiaosheng Si et al. (2020)

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DOI: 10.1109/TIE.2019.2952828

access: closed

type: Journal Article

metadata version: 2020-08-06

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  - https://dblp.org/rec/journals/tie/SiRHHS20
Xiaosheng Si, Ziqiang Ren, Xiaoxiang Hu, Changhua Hu, Quan Shi:
A Novel Degradation Modeling and Prognostic Framework for Closed-Loop Systems With Degrading Actuator. IEEE Trans. Ind. Electron. 67(11): 9635-9647 (2020)

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