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"A Bayesian zero-failure reliability demonstration test of high quality ..."

Tsai-Hung Fan, Chia-Chen Chang (2009)

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DOI: 10.1002/QRE.1009

access: closed

type: Journal Article

metadata version: 2020-07-09

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Tsai-Hung Fan, Chia-Chen Chang:
A Bayesian zero-failure reliability demonstration test of high quality electro-explosive devices. Qual. Reliab. Eng. Int. 25(8): 913-920 (2009)

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