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"Tunnel oxide degradation under pulsed stress."

G. Ghidini et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.017

access: closed

type: Journal Article

metadata version: 2024-01-16

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G. Ghidini, C. Capolupo, G. Giusto, A. Sebastiani, B. Stragliati, Maria Elena Vitali:
Tunnel oxide degradation under pulsed stress. Microelectron. Reliab. 45(9-11): 1337-1342 (2005)

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