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"Evaluation methodology of thin dielectrics for non-volatile memory ..."

G. Ghidini, D. Brazzelli (2002)

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DOI: 10.1016/S0026-2714(02)00173-7

access: closed

type: Journal Article

metadata version: 2020-02-22

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G. Ghidini, D. Brazzelli:
Evaluation methodology of thin dielectrics for non-volatile memory application. Microelectron. Reliab. 42(9-11): 1473-1480 (2002)

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