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"Intelligent maintenance prediction system for LED wafer testing machine."

Chien-Chang Hsu, Min-Sheng Chen (2016)

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DOI: 10.1007/S10845-013-0866-3

access: closed

type: Journal Article

metadata version: 2021-10-14

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Chien-Chang Hsu, Min-Sheng Chen:
Intelligent maintenance prediction system for LED wafer testing machine. J. Intell. Manuf. 27(2): 335-342 (2016)

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