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"Power divergence approach for one-shot device testing under competing risks."

N. Balakrishnan et al. (2023)

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DOI: 10.1016/J.CAM.2022.114676

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/jcam/BalakrishnanCMP23
N. Balakrishnan, Elena Castilla, Nirian Martín, Leandro Pardo:
Power divergence approach for one-shot device testing under competing risks. J. Comput. Appl. Math. 419: 114676 (2023)

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