default search action

combined dblp search
author search
venue search
publication search

ask others

"MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS Process."

Ming-Dou Ker, Kun-Hsien Lin, Che-Hao Chuang (2005)

> Home

Details and statistics

DOI: 10.1093/IETELE/E88-C.3.429

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ieicet/KerLC05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/KerLC05
Ming-Dou Ker, Kun-Hsien Lin, Che-Hao Chuang:
MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS Process. IEICE Trans. Electron. 88-C(3): 429-436 (2005)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.