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"Low-cost parametric test and diagnosis of RF systems using multi-tone ..."

Donghoon Han, Soumendu Bhattacharya, Abhijit Chatterjee (2007)

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DOI: 10.1049/IET-CDT:20060145

access: closed

type: Journal Article

metadata version: 2020-07-14

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  - https://dblp.org/rec/journals/iet-cdt/HanBC07
Donghoon Han, Soumendu Bhattacharya, Abhijit Chatterjee:
Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection. IET Comput. Digit. Tech. 1(3): 170-179 (2007)

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