default search action

combined dblp search
author search
venue search
publication search

ask others

"A new strategy for defect inspection by the virtual inspection in ..."

Jason Chao-Hsien Pan, Damon H. E. Tai (2011)

> Home

Details and statistics

DOI: 10.1016/J.CIE.2010.09.008

access: closed

type: Journal Article

metadata version: 2020-02-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/candie/PanT11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/candie/PanT11
Jason Chao-Hsien Pan, Damon H. E. Tai:
A new strategy for defect inspection by the virtual inspection in semiconductor wafer fabrication. Comput. Ind. Eng. 60(1): 16-24 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.