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"A patch analysis approach for seam-carved image detection."

Jyh-Da Wei et al. (2013)

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DOI: 10.1145/2503385.2503445

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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  dblp key:
  - conf/siggraph/WeiLWK13
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Jyh-Da Wei, Yu-Ju Lin, Yi-Jing Wu, Li-Wei Kang:
A patch analysis approach for seam-carved image detection. SIGGRAPH Posters 2013: 54

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