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"Investigation of the pulsed-IV degradation mechanism of GaN-HEMT under ..."

Yasunori Tateno et al. (2018)

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DOI: 10.1109/IRPS.2018.8353705

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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  dblp key:
  - conf/irps/TatenoKYN18
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Yasunori Tateno, Yasuyo Kurachi, Hiroshi Yamamoto, Takashi Nakabayashi:
Investigation of the pulsed-IV degradation mechanism of GaN-HEMT under high temperature storage tests. IRPS 2018: 2-1

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