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"Investigation of the capacitance deviation due to metal-fills and the ..."

Won-Seok Lee et al. (2003)

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DOI: 10.1109/ISQED.2003.1194761

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/isqed/LeeLPKPK03
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  persistent URL:
  - https://dblp.org/rec/conf/isqed/LeeLPKPK03
Won-Seok Lee, Keun-Ho Lee, Jin-Kyu Park, Tae-Kyung Kim, Young-Kwan Park, Jeong-Taek Kong:
Investigation of the capacitance deviation due to metal-fills and the effective interconnect geometry modeling. ISQED 2003: 373-376

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