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"Design to Avoid the Over-Gate-Driven Effect on ESD Protection Circuits in ..."

Ming-Dou Ker, Wen-Yi Chen (2004)

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DOI: 10.1109/ISQED.2004.1283714

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/isqed/KerC04
Ming-Dou Ker, Wen-Yi Chen:
Design to Avoid the Over-Gate-Driven Effect on ESD Protection Circuits in Deep-Submicron CMOS Processes. ISQED 2004: 445-450

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