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"Interaction-based Fault Detection and Classification Using Randomly Masked ..."

Jueun Kim et al. (2023)

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DOI: 10.1109/ICAIIC57133.2023.10067129

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-31

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  dblp key:
  - conf/icaiic/KimSHB23
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Jueun Kim, Seunghwan Song, Woo Young Hwang, Jun-Geol Baek:
Interaction-based Fault Detection and Classification Using Randomly Masked 1D Convolutional Neural Network. ICAIIC 2023: 479-482

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