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"Massive Multisite Variability-Aware Die Distribution Estimation for ..."

Praise O. Farayola et al. (2021)

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DOI: 10.1109/DTIS53253.2021.9505144

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-26

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  - conf/dtis/FarayolaBCSRC21
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Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation. DTIS 2021: 1-6

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