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"Test and reliability challenges in automotive microelectronics."

Christian Sebeke et al. (2006)

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DOI: 10.1109/DATE.2006.243894

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - conf/date/SebekeJHFSG06
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  - https://dblp.org/rec/conf/date/SebekeJHFSG06
Christian Sebeke, C. Jung, Klaus Harbich, S. Fuchs, J. Schwarz, Peter Göhner:
Test and reliability challenges in automotive microelectronics. DATE 2006: 547

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