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"High-throughput Von Neumann post-processing for random number generator."

Ruilin Zhang et al. (2018)

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DOI: 10.1109/VLSI-DAT.2018.8373253

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Ruilin Zhang, Sijia Chen, Chao Wan, Hirofumi Shinohara:
High-throughput Von Neumann post-processing for random number generator. VLSI-DAT 2018: 1-4

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