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"LISOCHIN: An NBTI Degradation Monitoring Sensor for Reliable CMOS Circuits."

Ambika Prasad Shah, Nandakishor Yadav, Santosh Kumar Vishvakarma (2017)

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DOI: 10.1007/978-981-10-7470-7_44

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

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  dblp key:
  - conf/vdat/ShahYV17
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  - https://dblp.org/rec/conf/vdat/ShahYV17
Ambika Prasad Shah, Nandakishor Yadav, Santosh Kumar Vishvakarma:
LISOCHIN: An NBTI Degradation Monitoring Sensor for Reliable CMOS Circuits. VDAT 2017: 441-451

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