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Piet Vanmeerbeek
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2020 – today
- 2024
- [c4]Davide Favero, Carlo De Santi
, Arno Stockman, Arianna Nardo, Piet Vanmeerbeek, Marnix Tack, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini:
$\mathrm{R}_{\text{ON}}$ and $\mathrm{V}_{\text{TH}}$ Extraction in Hard-Switched E-mode GaN HEMTs: Impact of Passivation and Layout. IRPS 2024: 1-4
2010 – 2019
- 2015
- [c3]Peter Moens, Abhishek Banerjee, P. Coppens, Aurore Constant, Piet Vanmeerbeek, Z. Li, F. Declercq, L. De Schepper, H. De Vleeschouwer, C. Liu, B. Padmanabhan, W. Jeon, J. Guo, A. Salih, Marnix Tack:
Technology and design of GaN power devices. ESSDERC 2015: 64-67 - [c2]Gaudenzio Meneghesso, Matteo Meneghini
Trapping induced parasitic effects in GaN-HEMT for power switching applications. ICICDT 2015: 1-4 - [c1]Matteo Meneghini
Evidence for temperature-dependent buffer-induced trapping in GaN-on-silicon power transistors. IRPS 2015: 2 - 2012
- [j4]Ana Villamor-Baliarda, Piet Vanmeerbeek, Michele Riccio
Influence of charge balance on the robustness of trench-based super junction diodes. Microelectron. Reliab. 52(9-10): 2409-2413 (2012) - 2011
- [j3]Ana Villamor-Baliarda, Piet Vanmeerbeek, Jaume Roig, Peter Moens, David Flores
Electric field unbalance for robust floating ring termination. Microelectron. Reliab. 51(9-11): 1959-1963 (2011) - 2010
- [j2]R. Charavel, Jaume Roig, S. Mouhoubi, P. Gassot, Filip Bauwens, Piet Vanmeerbeek, B. Desoete, Peter Moens, Eddy De Backer:
Next generation of Deep Trench Isolation for Smart Power technologies with 120 V high-voltage devices. Microelectron. Reliab. 50(9-11): 1758-1762 (2010)
2000 – 2009
- 2007
- [j1]R. Moonen, Piet Vanmeerbeek, G. Lekens, Ward De Ceuninck, Peter Moens, J. Boutsen:
Lifetime modeling of intrinsic gate oxide breakdown at high temperature. Microelectron. Reliab. 47(9-11): 1389-1393 (2007)
Coauthor Index
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