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Bernhard Wunderle
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2020 – today
- 2024
- [j15]Marcel Kettelgerdes, Nicolas Sarmiento, Hüseyin Erdogan, Bernhard Wunderle, Gordon Elger:
Precise Adverse Weather Characterization by Deep-Learning-Based Noise Processing in Automotive LiDAR Sensors. Remote. Sens. 16(13): 2407 (2024) - 2023
- [c4]Marcel Kettelgerdes, Amit Pandey, Denis Unruh, Hüseyin Erdogan, Bernhard Wunderle, Gordon Elger:
Automotive LiDAR Based Precipitation State Estimation Using Physics Informed Spatio-Temporal 3D Convolutional Neural Networks (PIST-CNN). M2VIP 2023: 1-6 - [i1]Marcel Kettelgerdes, Tjorven Hillmann, Thomas Hirmer, Hüseyin Erdogan, Bernhard Wunderle, Gordon Elger:
Accelerated Real-Life (ARL) Testing and Characterization of Automotive LiDAR Sensors to facilitate the Development and Validation of Enhanced Sensor Models. CoRR abs/2312.04229 (2023) - 2022
- [j14]Ayda Bouhamed, Nathanael Jöhrmann, Slim Naifar, Benny Böhm, Olav Hellwig, Bernhard Wunderle, Olfa Kanoun:
Collaborative Filler Network for Enhancing the Performance of BaTiO3/PDMS Flexible Piezoelectric Polymer Composite Nanogenerators. Sensors 22(11): 4181 (2022)
2010 – 2019
- 2017
- [j13]Jens Heilmann, Ivan Nikitin, Uwe Zschenderlein, Daniel May, Klaus Pressel, Bernhard Wunderle:
Reliability experiments of sintered silver based interconnections by accelerated isothermal bending tests. Microelectron. Reliab. 74: 136-146 (2017) - [j12]Peter Meszmer, Raul D. Rodriguez, Evgeniya Sheremet, Dietrich R. T. Zahn, Bernhard Wunderle:
Stress imaging in structural challenging MEMS with high sensitivity using micro-Raman spectroscopy. Microelectron. Reliab. 79: 104-110 (2017) - [j11]E. Liu, Thomas Zahner, Sebastian Besold, Bernhard Wunderle, Gordon Elger:
Location resolved transient thermal analysis to investigate crack growth in solder joints. Microelectron. Reliab. 79: 533-546 (2017) - 2016
- [j10]Emad A. Poshtan, Sven Rzepka, Christian Silber, Bernhard Wunderle:
An in-situ numerical-experimental approach for fatigue delamination characterization in microelectronic packages. Microelectron. Reliab. 62: 18-25 (2016) - [c3]Jens Bonitz, Simon Böttger, Sascha Hermann, Stefan E. Schulz, Thomas Gessner, Steffen Hartmann, Bernhard Wunderle:
Wafer-level technology for integration of carbon nanotubes into micro-electro-mechanical systems. NEMS 2016: 595-599 - 2014
- [j9]Florian Schindler-Saefkow, Florian Rost, Alexander Otto, R. Pantou, Raul Mroßko, Bernhard Wunderle, Bernd Michel, Sven Rzepka, Jürgen Keller:
Stress impact of moisture diffusion measured with the stress chip. Microelectron. Reliab. 54(6-7): 1243-1252 (2014) - 2013
- [j8]O. Hölck, Jörg Bauer, Tanja Braun, Hans Walter, Olaf Wittler, Bernhard Wunderle, Klaus-Dieter Lang:
Transport of moisture at epoxy-SiO2 interfaces investigated by molecular modeling. Microelectron. Reliab. 53(8): 1111-1116 (2013) - 2012
- [j7]O. Hölck, Jörg Bauer, Olaf Wittler, Bernd Michel, Bernhard Wunderle:
Comparative characterization of chip to epoxy interfaces by molecular modeling and contact angle determination. Microelectron. Reliab. 52(7): 1285-1290 (2012) - [c2]Christian Wagner, Steffen Hartmann, Bernhard Wunderle, Jörg Schuster, Stefan E. Schulz, Thomas Gessner:
Nanomechanics of CNTs for sensor application. SSD 2012: 1-5 - 2011
- [j6]O. Hölck, E. Dermitzaki, Bernhard Wunderle, Jörg Bauer, Bernd Michel:
Basic thermo-mechanical property estimation of a 3D-crosslinked epoxy/SiO2 interface using molecular modelling. Microelectron. Reliab. 51(6): 1027-1034 (2011) - 2010
- [j5]Bernhard Wunderle, E. Dermitzaki, O. Hölck, Jörg Bauer, Hans Walter, Q. Shaik, K. Rätzke, Franz Faupel, Bernd Michel, Herbert Reichl:
Molecular dynamics approach to structure-property correlation in epoxy resins for thermo-mechanical lifetime modeling. Microelectron. Reliab. 50(7): 900-909 (2010)
2000 – 2009
- 2009
- [c1]Thomas Fritzsch, Raul Mrossko, Tobias Baumgartner, Michael Toepper, Matthias Klein, Jürgen Wolf, Bernhard Wunderle, Herbert Reichl:
3-D thin chip integration technology - from technology development to application. 3DIC 2009: 1-8 - 2007
- [j4]Mike Roellig, Rainer Dudek, Steffen Wiese, Bjoern Boehme, Bernhard Wunderle, Klaus-Jürgen Wolter, Bernd Michel:
Fatigue analysis of miniaturized lead-free solder contacts based on a novel test concept. Microelectron. Reliab. 47(2-3): 187-195 (2007) - [j3]M. Spraul, Wolfgang Nüchter, A. Möller, Bernhard Wunderle, Bernd Michel:
Reliability of SnPb and Pb-free flip-chips under different test conditions. Microelectron. Reliab. 47(2-3): 252-258 (2007) - 2006
- [j2]Bernhard Wunderle, Bernd Michel:
Progress in reliability research in the micro and nano region. Microelectron. Reliab. 46(9-11): 1685-1694 (2006) - 2004
- [j1]Bernhard Wunderle, Wolfgang Nüchter, Andreas Schubert, Bernd Michel, Herbert Reichl:
Parametric FE-approach to flip-chip reliability under various loading conditions. Microelectron. Reliab. 44(12): 1933-1945 (2004)
Coauthor Index
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