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Bertrand Vrignon
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2010 – 2019
- 2015
- [c5]Bertrand Vrignon, A. Doridant, K. Abouda, Y. Gao, D. Pagnoux, T. Marek:
Near-field injection on a Safe System Basis Chip at silicon level. EMC Compo 2015: 131-136 - 2014
- [c4]Laurent Chusseau, Rachid Omarouayache, Jérémy Raoult, Sylvie Jarrix, Philippe Maurine, Karim Tobich, Alexandre Boyer, Bertrand Vrignon, John Shepherd, Thanh-Ha Le, Maël Berthier, Lionel Rivière, Bruno Robisson
, Anne-Lise Ribotta:
Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI). VLSI-SoC 2014: 1-6 - 2013
- [j5]Jianfei Wu, Alexandre Boyer, Jiancheng Li, Sonia Bendhia, Bertrand Vrignon:
LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing. Microelectron. Reliab. 53(9-11): 1273-1277 (2013) - [c3]Bertrand Vrignon, P. Caunegre, John Shepherd, Jianfei Wu:
Automatic verification of EMC immunity by simulation. EMC Compo 2013: 202-207 - 2012
- [j4]Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro:
IC Immunity Modeling Process Validation Using On-Chip Measurements. J. Electron. Test. 28(3): 339-348 (2012) - [j3]Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon:
Prediction of Long-term Immunity of a Phase-Locked Loop. J. Electron. Test. 28(6): 791-802 (2012) - [j2]Sonia Bendhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro, Thanh Vinh Dinh:
On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations. IEEE Trans. Instrum. Meas. 61(3): 696-707 (2012) - 2011
- [j1]Raúl Fernández-García, Ignacio Gil
A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior. IEICE Trans. Electron. 94-C(12): 1906-1908 (2011) - [c2]Alexandre Boyer, Sonia Ben Dhia, Binhong Li, Christophe Lemoine, Bertrand Vrignon:
Prediction of long-term immunity of a phase-locked loop. LATW 2011: 1-6 - [c1]Sonia Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro:
IC immunity modeling process validation using on-chip measurements. LATW 2011: 1-6
Coauthor Index
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