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Etienne Sicard
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2010 – 2019
- 2019
- [c12]Esteban Garzón, Felix Chavez, Diego Jaramillo, Luis Sanchez, Sofia Lara, Carlos Macias, Eliana Acurio, Luis-Miguel Procel, Lionel Trojman, Etienne Sicard:
Microprocessor Design with a Direct Bluetooth Connection in 45 nm Technology Using Microwind. LASCAS 2019: 105-108 - 2018
- [c11]Corine Astésano, Mathieu Balaguer, Jérôme Farinas, Corinne Fredouille, Pascal Gaillard, Alain Ghio, Imed Laaridh, Muriel Lalain, Benoît Lepage, Julie Mauclair, Olivier Nocaudie, Julien Pinquier, Oriol Pont, Gilles Pouchoulin, Michèle Puech, Danièle Robert, Etienne Sicard, Virginie Woisard:
Carcinologic Speech Severity Index Project: A Database of Speech Disorder Productions to Assess Quality of Life Related to Speech After Cancer. LREC 2018 - 2017
- [c10]Rosario Gil Ortego, Manuel Castro Gil, Slavka Tzanova, Etienne Sicard:
Work in progress: MicroElectronics Cloud Alliance: The design of new open educational resources for a educational cloud. MSE 2017: 43-44 - 2015
- [c9]Etienne Sicard, Alexandre Boyer, Priscila Fernandez-Lopez, An Zhou, Nicolas Marier, Frédéric Lafon:
EMC performance analysis of a processor/memory system using PCB and Package-On-Package. EMC Compo 2015: 238-243 - [c8]Abhishek Ramanujan, Etienne Sicard, Alexandre Boyer, Jean-Luc Levant, Christian Marot, Frédéric Lafon:
Developing a universal exchange format for Integrated Circuit Emission Model - Conducted Emissions. EMC Compo 2015: 252-257 - 2013
- [c7]Etienne Sicard, Jianfei Wu, Jiancheng Li:
Signal integrity and EMC performance enhancement using 3D integrated circuits - A case study. EMC Compo 2013: 10-14 - [c6]L. Guibert, P. Millot, Xavier Ferrières, Etienne Sicard:
Study of radiated immunity of an electronic system in a reverberating chamber. EMC Compo 2013: 74-77 - 2010
- [j8]Syed Mahfuzul Aziz, Etienne Sicard, Sonia Ben Dhia:
Effective Teaching of the Physical Design of Integrated Circuits Using Educational Tools. IEEE Trans. Educ. 53(4): 517-531 (2010)
2000 – 2009
- 2008
- [j7]Ali Alaeldine, Nicolas Lacrampe, Alexandre Boyer, Richard Perdriau, Fabrice Caignet, Mohammed Ramdani, Etienne Sicard, M'hamed Drissi:
Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits. Microelectron. J. 39(12): 1728-1735 (2008) - [c5]Thomas Ordas, Mathieu Lisart, Etienne Sicard, Philippe Maurine, Lionel Torres:
Near-Field Mapping System to Scan in Time Domain the Magnetic Emissions of Integrated Circuits. PATMOS 2008: 229-236 - 2005
- [j6]Etienne Sicard, J. M. Dienot:
Issues in electromagnetic compatibility of integrated circuits: emission and susceptibility. Microelectron. Reliab. 45(9-11): 1277-1284 (2005) - [c4]Henrique Jorge Quaresma, Pedro M. Santos, Antonio M. Cruz Serra, Etienne Sicard:
A methodology for extracting unknown integrated circuit process parameters. ICECS 2005: 1-4 - 2004
- [j5]Etienne Sicard:
Electromagnetic compatibility of integrated circuits. Microelectron. J. 35(6): 485-486 (2004) - [j4]C. Lochot, S. Calvet, Sonia Ben Dhia, Etienne Sicard:
REGINA test mask: research on EMC guidelines for integrated automotive circuits. Microelectron. J. 35(6): 509-523 (2004) - 2001
- [j3]Fabrice Caignet, Sonia Delmas-Bendhia, Etienne Sicard:
The challenge of signal integrity in deep-submicrometer CMOS technology. Proc. IEEE 89(4): 556-573 (2001) - 2000
- [j2]Fabrice Caignet, S. D.-B. Dhia, Etienne Sicard:
On the measurement of crosstalk in integrated circuits. IEEE Trans. Very Large Scale Integr. Syst. 8(5): 606-609 (2000)
1990 – 1999
- 1999
- [c3]Etienne Sicard, Chen Xi:
A PC-based Educational Tool for CMOS Integrated Circuit Design. MSE 1999: 47-48 - 1993
- [j1]A. K. Betts, Ivo Bolsens, Etienne Sicard, Marc Renaudin, Adrian Johnstone:
SMILE: A scalable microcontroller library element. Microprocess. Microprogramming 39(2-5): 259-262 (1993) - 1992
- [c2]Etienne Sicard:
An efficient method for the recognition of printed music. ICPR (3) 1992: 573-576 - 1990
- [c1]Etienne Sicard, Kozo Kinoshita:
On the evaluation of process-fault tolerance ability of CMOS integrated circuits. ITC 1990: 948-954
Coauthor Index
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