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Pedro M. Ramos

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affiliation: Technical University of Lisbon, Portugal

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2020 – today

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2023
[j16]
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Nuno M. Rodrigues, Fernando M. Janeiro, Pedro M. Ramos:
Deep Learning for Power Quality Event Detection and Classification Based on Measured Grid Data. IEEE Trans. Instrum. Meas. 72: 1-11 (2023)
[c14]
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Pasquale Arpaia, Giovanni Carone, Nicolò Castelli, Giovanni D'Errico, Ludovica Gargiulo, Luigi Maffei, Giovanna Mastrati, Nicola Moccaldi, Marco Nalin, Alessandro Perin, Mauro Picciafuoco, Cosimo Puttilli, Pedro M. Ramos, Rachele Robbio:
EEG and HRV-Based Assessment of Neurosurgeons Training for Anxiety Regulation and Stress Monitoring. MetroXRAINE 2023: 652-657
2022
[c13]
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  - conf/memea/AnnuzziABCCMMRT22
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Giovanni Annuzzi, Pasquale Arpaia, Lutgarda Bozzetto, Giusy Carleo, Ornella Cuomo, Francesca Mancino, Nicola Moccaldi, Pedro M. Ramos, Maurizio Taglialatela:
Measuring insulin absorption by impedance spectroscopy. A feasibility study. MeMeA 2022: 1-5
2021
[j15]
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Pasquale Arpaia, Marco Buzio, Alessandro Parrella, Mariano Pentella, Pedro M. Ramos:
A Static-Sample Magnetometer for Characterizing Weak Magnetic Materials. IEEE Trans. Instrum. Meas. 70: 1-9 (2021)
2020
[j14]
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Pasquale Arpaia, Marco Buzio, Susana Izquierdo Bermudez, Annalisa Liccardo, Alessandro Parrella, Mariano Pentella, Pedro M. Ramos, Edvard Stubberud:
A Superconducting Permeameter for Characterizing Soft Magnetic Materials at High Fields. IEEE Trans. Instrum. Meas. 69(7): 4200-4209 (2020)
[c12]
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Nuno M. Rodrigues, João P. Carvalho, Fernando M. Janeiro, Pedro M. Ramos:
Electrical Power Grid Frequency Estimation with Fuzzy Boolean Nets. IPMU (1) 2020: 667-679

2010 – 2019

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2018
[c11]
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Pedro M. Ramos:
How signal processing is changing impedance spectroscopy. I2MTC 2018: 1-6
[c10]
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Nuno M. Rodrigues, Fernando M. Janeiro, Pedro M. Ramos:
Digital filter performance for zero crossing detection in power quality embedded measurement systems. I2MTC 2018: 1-6
2016
[c9]
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Fernando M. Janeiro, Pedro M. Ramos:
A comparative analysis between genetic algorithms and complex nonlinear least squares on electrical impedance characterization. I2MTC 2016: 1-6
[c8]
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Fernando M. Janeiro, Pedro M. Ramos, Filipe Carretas, Frank Wagner:
Cloud base height measurement system based on stereo vision with automatic calibration. I2MTC 2016: 1-5
[c7]
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Pedro M. Ramos, Fernando M. Janeiro:
Vector fitting based automatic circuit identification. I2MTC 2016: 1-6
2014
[j13]
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  - journals/tim/RosadoRP14
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Luis S. Rosado, Pedro M. Ramos, Moisés Piedade:
Real-Time Processing of Multifrequency Eddy Currents Testing Signals: Design, Implementation, and Evaluation. IEEE Trans. Instrum. Meas. 63(5): 1262-1271 (2014)
[c6]
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Fernando M. Janeiro, Carlos A. C. Fernandes, Jorge R. Costa, Pedro M. Ramos:
RFID chip characterization through S-parameter measurements and gene expression programming. I2MTC 2014: 207-211
[c5]
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Ruben Abrantes, Luis S. Rosado, Pedro M. Ramos, Moisés Piedade:
Embedded measurement system for non-destructive testing using new eddy currents planar array probe. I2MTC 2014: 583-589
[c4]
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  - conf/i2mtc/SantosJR14
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Jose Santos, Fernando M. Janeiro, Pedro M. Ramos:
Embedded viscosity measurement system using a vibrating-wire sensor. I2MTC 2014: 824-828
[c3]
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Diogo Eloi Aguiam, Luis S. Rosado, Pedro M. Ramos, Moisés Piedade:
Portable instrument for eddy currents Non-Destructive Testing based on heterodyning techniques. I2MTC 2014: 1368-1372
2013
[j12]
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Luis S. Rosado, Fernando M. Janeiro, Pedro M. Ramos, Moisés Piedade:
Defect Characterization With Eddy Current Testing Using Nonlinear-Regression Feature Extraction and Artificial Neural Networks. IEEE Trans. Instrum. Meas. 62(5): 1207-1214 (2013)
[j11]
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Fernando M. Janeiro, Jose Santos, Pedro M. Ramos:
Gene Expression Programming in Sensor Characterization: Numerical Results and Experimental Validation. IEEE Trans. Instrum. Meas. 62(5): 1373-1381 (2013)
[c2]
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Luis S. Rosado, Moisés Simões Piedade, Tiago Catarrunas, Pedro M. Ramos:
Real-time processing of multi-frequency eddy currents testing signals. I2MTC 2013: 1336-1341
2011
[c1]
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  - conf/eurocon/SantosR11
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Jose Santos, Pedro M. Ramos:
Application of compensation techniques in a dsPIC based impedance measuring system. EUROCON 2011: 1-4

2000 – 2009

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2009
[j10]
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Fernando M. Janeiro, Pedro M. Ramos:
Impedance Measurements Using Genetic Algorithms and Multiharmonic Signals. IEEE Trans. Instrum. Meas. 58(2): 383-388 (2009)
[j9]
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Tomás Radil, Pedro M. Ramos, A. Cruz Serra:
New Spectrum Leakage Correction Algorithm for Frequency Estimation of Power System Signals. IEEE Trans. Instrum. Meas. 58(5): 1670-1679 (2009)
[j8]
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Pedro M. Ramos, Fernando M. Janeiro, Mouhaydine Tlemçani, A. Cruz Serra:
Recent Developments on Impedance Measurements With DSP-Based Ellipse-Fitting Algorithms. IEEE Trans. Instrum. Meas. 58(5): 1680-1689 (2009)
2008
[j7]
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  - journals/csi/RamosS08
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Pedro M. Ramos, A. Cruz Serra:
Impedance measurement using multiharmonic least-squares waveform fitting algorithm. Comput. Stand. Interfaces 30(5): 323-328 (2008)
[j6]
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Tomás Radil, Pedro M. Ramos, A. Cruz Serra:
Impedance Measurement With Sine-Fitting Algorithms Implemented in a DSP Portable Device. IEEE Trans. Instrum. Meas. 57(1): 197-204 (2008)
[j5]
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Pedro M. Ramos, José Miguel Dias Pereira, Helena Maria Geirinhas Ramos, A. Lopes Ribeiro:
A Four-Terminal Water-Quality-Monitoring Conductivity Sensor. IEEE Trans. Instrum. Meas. 57(3): 577-583 (2008)
[j4]
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Tomás Radil, Pedro M. Ramos, Fernando M. Janeiro, A. Cruz Serra:
PQ Monitoring System for Real-Time Detection and Classification of Disturbances in a Single-Phase Power System. IEEE Trans. Instrum. Meas. 57(8): 1725-1733 (2008)
2007
[j3]
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Pedro M. Ramos, A. Cruz Serra:
Least Squares Multiharmonic Fitting: Convergence Improvements. IEEE Trans. Instrum. Meas. 56(4): 1412-1418 (2007)
2006
[j2]
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Pedro M. Ramos, Manuel Fonseca da Silva, Raul Carneiro Martins, António Manuel da Cruz Serra:
Simulation and experimental results of multiharmonic least-squares fitting algorithms applied to periodic signals. IEEE Trans. Instrum. Meas. 55(2): 646-651 (2006)
2005
[j1]
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António Manuel da Cruz Serra, Manuel Fonseca da Silva, Pedro M. Ramos, Raul Carneiro Martins, Linus Michaeli, Ján Saliga:
Combined spectral and histogram analysis for fast ADC testing. IEEE Trans. Instrum. Meas. 54(4): 1617-1623 (2005)

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