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Q.-H. Duong

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2000 – 2009

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2005
[j3]
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  - journals/mr/YacineFBSCLDBPP05
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K. Yacine, F. Flourens, David Bourrier, Ludovic Salvagnac, P. Calmont, Xavier Lafontan, Q.-H. Duong, Lionel Buchaillot, D. Peyrou, Patrick Pons:
Biaxial initial stress characterization of bilayer gold RF-switches. Microelectron. Reliab. 45(9-11): 1776-1781 (2005)
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Q.-H. Duong, Lionel Buchaillot, Dominique Collard, Petra Schmitt, Xavier Lafontan, Patrick Pons, F. Flourens, Francis Pressecq:
Thermal and electrostatic reliability characterization in RF MEMS switches. Microelectron. Reliab. 45(9-11): 1790-1793 (2005)
2003
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Petra Schmitt, Francis Pressecq, Xavier Lafontan, Q.-H. Duong, Patrick Pons, Jean Marc Nicot, Coumar Oudéa, Daniel Estève, Jean-Yves Fourniols, Henri Camon:
Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling. Microelectron. Reliab. 43(9-11): 1957-1962 (2003)

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