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Hong-Dar Lin
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2020 – today
- 2024
- [j18]Hong-Dar Lin, Cheng-Kai Jheng, Chou-Hsien Lin, Hung-Tso Chang:
Utilizing Deep Learning for Defect Inspection in Hand Tool Assembly. Sensors 24(11): 3635 (2024) - 2023
- [j17]Hong-Dar Lin, Huan-Hua Tsai, Chou-Hsien Lin, Hung-Tso Chang:
Optical Panel Inspection Using Explicit Band Gaussian Filtering Methods in Discrete Cosine Domain. Sensors 23(3): 1737 (2023) - [j16]Hong-Dar Lin, Tung-Hsin Lee, Chou-Hsien Lin, Hsin-Chieh Wu
:
Optical Imaging Deformation Inspection and Quality Level Determination of Multifocal Glasses. Sensors 23(9): 4497 (2023) - 2022
- [j15]Hong-Dar Lin, Zi-Ting Qiu, Chou-Hsien Lin:
Incorporating Visual Defect Identification and Determination of Occurrence Side in Touch Panel Quality Inspection. IEEE Access 10: 90213-90228 (2022)
2010 – 2019
- 2018
- [j14]Tin-Chih Toly Chen
Advanced Artificial Neural Networks. Algorithms 11(7): 102 (2018) - 2013
- [j13]Yuan-Shyi Peter Chiu, Hong-Dar Lin
An innovative blemish detection system for curved LED lenses. Expert Syst. Appl. 40(2): 471-479 (2013) - [j12]Hong-Dar Lin, Fan-Yun Pai, Singa Wang Chiu:
A note on "intra-supply chain system with multiple sales locations and quality assurance". Expert Syst. Appl. 40(11): 4730-4732 (2013) - [j11]Hong-Dar Lin, Fan-Yun Pai, Singa Wang Chiu:
Corrigendum to 'A note on "Intra-supply chain system with multiple sales locations and quality assurance"' [Experts Systems with Applications 40 (11) (2013) 4730-4732]. Expert Syst. Appl. 40(15): 6222 (2013) - 2012
- [j10]Hong-Dar Lin, Yuan-Shyi Peter Chiu:
Note on "replenishment run time problem with machine breakdown and failure in rework". Expert Syst. Appl. 39(17): 13070-13072 (2012) - 2011
- [j9]Yuan-Shyi Peter Chiu, Hong-Dar Lin, Ming-Hon Hwang, Nong Pan:
Computational Optimization of Manufacturing Batch Size and Shipment for an Integrated EPQ Model with Scrap. Am. J. Comput. Math. 1(3): 202-207 (2011) - [j8]Yuan-Shyi Peter Chiu, Hong-Dar Lin
Mathematical modeling for solving manufacturing run time problem with defective rate and random machine breakdown. Comput. Ind. Eng. 60(4): 576-584 (2011) - [j7]Hong-Dar Lin
Flaw detection of domed surfaces in LED packages by machine vision system. Expert Syst. Appl. 38(12): 15208-15216 (2011) - 2010
- [c6]Hong-Dar Lin, Chung-Yu Chung, Wan-Ting Lin:
Automated Industrial Inspection of LED Chips Using Multivariate Factor Analysis. IPCV 2010: 283-288
2000 – 2009
- 2009
- [j6]Hong-Dar Lin
Automated defect inspection of light-emitting diode chips using neural network and statistical approaches. Expert Syst. Appl. 36(1): 219-226 (2009) - [j5]Hong-Dar Lin
Automated process adjustments of chip cutting operations using neural network and statistical approaches. Expert Syst. Appl. 36(3): 4338-4345 (2009) - [j4]Yuan-Shyi Peter Chiu, Hong-Dar Lin
A hybrid approach based on Hotelling statistics for automated visual inspection of display blemishes in LCD panels. Expert Syst. Appl. 36(10): 12332-12339 (2009) - [c5]Hong-Dar Lin, Yuan-Shyi Peter Chiu, Wan-Ting Lin:
Automated Industrial Inspection of Light-emitting Diodes Using Computer Vision. IPCV 2009: 59-65 - 2008
- [j3]Hong-Dar Lin, Yuan-Shyi Peter Chiu, Chia-Kuan Ting:
A note on optimal replenishment policy for imperfect quality EMQ model with rework and backlogging. Comput. Math. Appl. 56(11): 2819-2824 (2008) - [j2]Hong-Dar Lin
Tiny surface defect inspection of electronic passive components using discrete cosine transform decomposition and cumulative sum techniques. Image Vis. Comput. 26(5): 603-621 (2008) - 2007
- [j1]Hong-Dar Lin
Automated visual inspection of ripple defects using wavelet characteristic based multivariate statistical approach. Image Vis. Comput. 25(11): 1785-1801 (2007) - [c4]Hong-Dar Lin, Chung-Yu Chung, Singa Wang Chiu:
Computer-Aided Vision System for Surface Blemish Detection of LED Chips. ICANNGA (2) 2007: 525-533 - [c3]Hong-Dar Lin, Chung-Yu Chung:
A Wavelet-Based Neural Network Applied to Surface Defect Detection of LED Chips. ISNN (2) 2007: 785-792 - 2006
- [c2]Hong-Dar Lin, Chih-Hao Chien:
Automated Detection of Color Non-Uniformity Defects in TFT-LCD. IJCNN 2006: 1405-1412 - [c1]Hong-Dar Lin, Singa Wang Chiu:
Computer-Aided Vision System for MURA-Type Defect Inspection in Liquid Crystal Displays. PSIVT 2006: 442-452
Coauthor Index
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