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Robert Van Rijsinge

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2010 – 2019

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2016
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  - conf/ets/MarinissenZKHHC16
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Erik Jan Marinissen, Yervant Zorian, Mario Konijnenburg, Chih-Tsun Huang, Ping-Hsuan Hsieh, Peter Cockburn, Jeroen Delvaux, Vladimir Rozic, Bohan Yang, Dave Singelée, Ingrid Verbauwhede, Cedric Mayor, Robert Van Rijsinge, Cocoy Reyes:
IoT: Source of test challenges. ETS 2016: 1-10

2000 – 2009

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2007
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Lei Ma, Geert Seuren, Robert Van Rijsinge, Corné Bastiaansen, Leon van der Dussen:
A Design-Based Structural Test Method for a Switched-Resistor DAC. J. Electron. Test. 23(6): 559-567 (2007)
2004
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  - conf/itc/VermeulenHKMR04
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Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge:
Trends in Testing Integrated Circuits. ITC 2004: 688-697

1990 – 1999

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1990
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Robert Van Rijsinge, A. A. R. M. Haggenburg, C. de Vries, Hans Wallinga:
From specification to measurement: the bottleneck in analog industrial testing. ITC 1990: 177-182

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