default search action

combined dblp search
author search
venue search
publication search

ask others

Chung-Huang Yeh

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

2020 – today

see FAQ

What is the meaning of the colors in the publication lists?

2023
[j5]
- view
  authority control:
- export record
  dblp key:
  - journals/dt/YehC23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/YehC23
Chung-Huang Yeh, Jwu E. Chen:
Recycling Test Methods to Improve Test Capacity and Increase Chip Shipments. IEEE Des. Test 40(3): 45-52 (2023)
[j4]
- view
  authority control:
- export record
  dblp key:
  - journals/et/YehC23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/YehC23
Chung-Huang Yeh, Jwu E. Chen:
Multiple Retest Systems for Screening High-Quality Chips. J. Electron. Test. 39(2): 207-225 (2023)
[j3]
- view
  authority control:
- export record
  dblp key:
  - journals/jcsc/YehC23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jcsc/YehC23
Chung-Huang Yeh, Jwu E. Chen:
Prediction of the Test Yield of Future Integrated Circuits Through the Deductive Estimation Method. J. Circuits Syst. Comput. 32(12): 2350202:1-2350202:20 (2023)
2022
[j2]
- view
  - electronic edition via DOI (open access)
  - references & citations
  authority control:
- export record
  dblp key:
  - journals/sensors/YehC22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/sensors/YehC22
Chung-Huang Yeh, Jwu E. Chen:
Application of Three-Repetition Tests Scheme to Improve Integrated Circuits Test Quality to Near-Zero Defect. Sensors 22(11): 4158 (2022)
2020
[c1]
- view
  authority control:
- export record
  dblp key:
  - conf/itc-asia/YehC20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc-asia/YehC20
Chung-Huang Yeh, Jwu E. Chen:
The Decision Mechanism Uses the Multiple-Tests Scheme to Improve Test Yield in IC Testing. ITC-Asia 2020: 88-93

2010 – 2019

see FAQ

What is the meaning of the colors in the publication lists?

2019
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/et/YehC19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/YehC19
Chung-Huang Yeh, Jwu E. Chen:
Repeated Testing Applications for Improving the IC Test Quality to Achieve Zero Defect Product Requirements. J. Electron. Test. 35(4): 459-472 (2019)

Coauthor Index

see FAQ

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.