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Mingyue Guan

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2010 – 2019

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2017
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Yao Ma, Pengfei Xu, Mingyue Guan, Filippo Boi, Gao Bo, Min Gong, Xue Wu, Yuxin Wang, Hua Wang, ZengQiang Niao:
Analysis of deep level defects in bipolar junction transistors irradiated by 2 MeV electrons. Microelectron. Reliab. 79: 149-152 (2017)

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