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Donald L. Wheater
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2000 – 2009
- 2003
- [j4]Darren Anand, Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater:
An On-Chip Self-Repair Calculation and Fusing Methodology. IEEE Des. Test Comput. 20(5): 67-75 (2003) - [c9]Donald L. Wheater:
ATE-Customer Perspectives & Requirements Panel. ITC 2003: 1298 - 2002
- [j3]Robert C. Aitken, Donald L. Wheater:
Guest Editors' Introduction: Stressing the Fundamentals. IEEE Des. Test Comput. 19(5): 54-55 (2002) - [c8]Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater:
On-Chip Repair and an ATE Independent Fusing Methodology. ITC 2002: 178-186 - [c7]Lee Song, Rudy Garcia, Andrew Levy, Donald L. Wheater:
A Successful DFT Tester: What Will It Look Like? Is Revolution in Test Approaches Required? VTS 2002: 87-90 - 2001
- [j2]Tony Ambler, Donald L. Wheater:
Test Trade-Offs Take Center Stage at ITC. IEEE Des. Test Comput. 18(5): 59- (2001) - [c6]Bernd Könemann, Carl Barnhart, Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, Donald L. Wheater:
A SmartBIST Variant with Guaranteed Encoding. Asian Test Symposium 2001: 325-
1990 – 1999
- 1997
- [c5]Melvin A. Breuer, Bozena Kaminska, John E. McDermid, V. Rayapathi, Donald L. Wheater:
Will 0.1um Digital Circuits Require Mixed-Signal Testing. VTS 1997: 186-187 - 1994
- [c4]Donald L. Wheater, Phil Nigh, Jeanne Trinko Mechler, Luke Lacroix:
ASIC Test Cost/Strategy Trade-offs. ITC 1994: 93-102 - 1990
- [j1]Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater:
Low-Cost Testing of High-Density Logic Components. IEEE Des. Test Comput. 7(2): 15-28 (1990)
1980 – 1989
- 1989
- [c3]Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater:
Low Cost Testing of High Density Logic Components. ITC 1989: 550-557 - 1984
- [c2]Donald L. Wheater:
IBM's Cost Performance Array Tester Architecture for the 80's. ITC 1984: 466-470 - 1981
- [c1]Donald L. Wheater, Richard Soderman:
The Series/1 as a Test System Controller for System Verification and Calibration. ITC 1981: 377-380
Coauthor Index
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