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Toshiki Nakamura
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2020 – today
- 2021
- [c12]Ryo Tanabe, Harsh Purohit, Kota Dohi, Takashi Endo, Yuki Nikaido, Toshiki Nakamura, Yohei Kawaguchi:
MIMII Due: Sound Dataset for Malfunctioning Industrial Machine Investigation and Inspection with Domain Shifts Due to Changes in Operational and Environmental Conditions. WASPAA 2021: 21-25 - [i5]Yuiko Sakuma, Hiroshi Sumihiro, Jun Nishikawa, Toshiki Nakamura, Ryoji Ikegaya:
n-hot: Efficient bit-level sparsity for powers-of-two neural network quantization. CoRR abs/2103.11704 (2021) - [i4]Ryo Tanabe, Harsh Purohit, Kota Dohi, Takashi Endo, Yuki Nikaido, Toshiki Nakamura, Yohei Kawaguchi:
MIMII DUE: Sound Dataset for Malfunctioning Industrial Machine Investigation and Inspection with Domain Shifts due to Changes in Operational and Environmental Conditions. CoRR abs/2105.02702 (2021) - 2020
- [c11]Yuma Koizumi, Yohei Kawaguchi, Keisuke Imoto, Toshiki Nakamura, Yuki Nikaido, Ryo Tanabe, Harsh Purohit, Kaori Suefusa, Takashi Endo, Masahiro Yasuda, Noboru Harada:
Description and Discussion on DCASE2020 Challenge Task2: Unsupervised Anomalous Sound Detection for Machine Condition Monitoring. DCASE 2020: 81-85 - [i3]Yuma Koizumi, Yohei Kawaguchi, Keisuke Imoto, Toshiki Nakamura, Yuki Nikaido, Ryo Tanabe, Harsh Purohit, Kaori Suefusa, Takashi Endo, Masahiro Yasuda, Noboru Harada:
Description and Discussion on DCASE2020 Challenge Task2: Unsupervised Anomalous Sound Detection for Machine Condition Monitoring. CoRR abs/2006.05822 (2020)
2010 – 2019
- 2019
- [j2]Toshiki Nakamura
, Yoshiaki Deguchi
Adaptive Artificial Neural Network-Coupled LDPC ECC as Universal Solution for 3-D and 2-D, Charge-Trap and Floating-Gate NAND Flash Memories. IEEE J. Solid State Circuits 54(3): 745-754 (2019) - [j1]Yoshiaki Deguchi
3-D NAND Flash Value-Aware SSD: Error-Tolerant SSD Without ECCs for Image Recognition. IEEE J. Solid State Circuits 54(6): 1800-1811 (2019) - [c10]Shun Suzuki, Kyoji Mizoguchi, Hikaru Watanabe, Toshiki Nakamura, Yoshiaki Deguchi, Keita Mizushina, Ken Takeuchi:
Privacy-Aware Data-Lifetime Control NAND Flash System for Right to be Forgotten with In-3D Vertical Cell Processing. A-SSCC 2019: 231-234 - [c9]Toshiki Nakamura, Anna Zhu, Seiichi Uchida:
Scene Text Magnifier. ICDAR 2019: 825-830 - [i2]Toshiki Nakamura, Anna Zhu, Seiichi Uchida:
Scene Text Magnifier. CoRR abs/1907.00693 (2019) - 2018
- [c8]Toshiki Nakamura, Yoshiaki Deguchi
9.1x Error acceptable adaptive artificial neural network coupled LDPC ECC for charge-trap and floating-gate 3D-NAND flash memories. CICC 2018: 1-4 - [c7]Shun Suzuki, Yoshiaki Deguchi
Endurance-based Dynamic VTHDistribution Shaping of 3D-TLC NAND Flash Memories to Suppress Both Lateral Charge Migration and Vertical Charge De-trap and Increase Data-retention Time by 2.7x. ESSDERC 2018: 150-153 - [c6]Shun Suzuki, Yoshiaki Deguchi
Error elimination ECC by horizontal error detection and vertical-LDPC ECC to increase data-retention time by 230% and acceptable bit-error rate by 90% for 3D-NAND flash SSDs. IRPS 2018: 7-1 - [c5]Atsuna Hayakawa, Toshiki Nakamura, Yoshiaki Deguchi
Data-Aware Partial ECC with Data Modulation of ReRAM with Non-volatile In-memory Computing for Image Recognition with Deep Neural Network. ISCAS 2018: 1-5 - [c4]Keita Mizushina, Toshiki Nakamura, Yoshiaki Deguchi
Layer-by-layer Adaptively Optimized ECC of NAND flash-based SSD Storing Convolutional Neural Network Weight for Scene Recognition. ISCAS 2018: 1-5 - 2017
- [c3]Yoshiaki Deguchi
12× bit-error acceptable, 300× extended data-retention time, value-aware SSD with vertical 3D-TLC NAND flash memories for image recognition. CICC 2017: 1-4 - [c2]Toshiki Nakamura, Anna Zhu, Keiji Yanai
Scene Text Eraser. ICDAR 2017: 832-837 - [i1]Toshiki Nakamura, Anna Zhu, Keiji Yanai, Seiichi Uchida:
Scene Text Eraser. CoRR abs/1705.02772 (2017) - 2015
- [c1]Chia-Hung Dylan Tsai
An on-chip, electricity-free and single-layer pressure sensor for microfluidic applications. IROS 2015: 165-170
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