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Dave Young

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2020 – today

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2020
[c2]
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  dblp key:
  - conf/irps/SuACEGLMOPPPRWY20
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Chen-Yi Su, Mark Armstrong, Sunny Chugh, Mohammed El-tanani, Hannes Greve, Hai Li, Mahjabin Maksud, Benjamin Orr, Christopher Perini, James Palmer, Leif Paulson, Stephen Ramey, James Waldemer, Yang Yang, Dave Young:
Reliability Characterization for 12 V Application Using the 22FFL FinFET Technology. IRPS 2020: 1-5

2010 – 2019

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2015
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Md. Enamul Kabir, Dave Young, Bahattin Kilic, Ioan Sauciuc, Carl Sapp, Gerald S. Leatherman:
Package induced stress impact on transistor performance for ultra-thin SoC. IRPS 2015: 5

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