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Maximilien Glorieux
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2020 – today
- 2021
- [c12]Aneesh Balakrishnan
, Dan Alexandrescu, Maksim Jenihhin, Thomas Lange, Maximilien Glorieux:
Gate-Level Graph Representation Learning: A Step Towards the Improved Stuck-at Faults Analysis. ISQED 2021: 24-30 - [i8]Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin:
Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors. CoRR abs/2104.01812 (2021) - [i7]Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin:
The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications. CoRR abs/2104.01900 (2021) - [i6]Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin:
Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects. CoRR abs/2104.01908 (2021) - [i5]Dan Alexandrescu, Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux:
Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models. CoRR abs/2104.10941 (2021) - 2020
- [c11]Dan Alexandrescu, Aneesh Balakrishnan
Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models. IOLTS 2020: 1-6 - [c10]Thomas Lange, Aneesh Balakrishnan
Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features. IOLTS 2020: 1-7 - [c9]Aneesh Balakrishnan
Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects. MECO 2020: 1-5 - [i4]Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone:
Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks. CoRR abs/2002.05455 (2020) - [i3]Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone:
Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits. CoRR abs/2002.08882 (2020) - [i2]Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone:
On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques. CoRR abs/2002.09945 (2020) - [i1]Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone:
Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features. CoRR abs/2008.13664 (2020)
2010 – 2019
- 2019
- [c8]Aneesh Balakrishnan
Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors. AHS 2019: 72-78 - [c7]Thomas Lange, Aneesh Balakrishnan
On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques. DSN (Supplements) 2019: 35-41 - [c6]Thomas Lange
Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks. DTIS 2019: 1-6 - [c5]Thomas Lange, Aneesh Balakrishnan
Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits. IOLTS 2019: 7-14 - [c4]Aneesh Balakrishnan
The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications. NORCAS 2019: 1-7 - 2018
- [c3]Luca Sterpone
A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs. AHS 2018: 120-126 - 2017
- [c2]Dan Alexandrescu, Adrian Evans, Maximilien Glorieux, Issam Nofal:
EDA support for functional safety - How static and dynamic failure analysis can improve productivity in the assessment of functional safety. IOLTS 2017: 145-150 - 2015
- [c1]Dan Alexandrescu, Adrian Evans, Enrico Costenaro, Maximilien Glorieux:
A call for cross-layer and cross-domain reliability analysis and management. IOLTS 2015: 19-22 - 2014
- [j1]Jean-Luc Autran, Maximilien Glorieux, Daniela Munteanu
Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits. Microelectron. Reliab. 54(9-10): 2278-2283 (2014)
Coauthor Index
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