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LeRoy Winemberg
Person information
- affiliation: Intel Corp., Hillsboro, OR, USA
- affiliation: NXP Semiconductors, Austin, TX, USA
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2020 – today
- 2021
- [j9]Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev:
Fault-based Built-in Self-test and Evaluation of Phase Locked Loops. ACM Trans. Design Autom. Electr. Syst. 26(3): 20:1-20:18 (2021)
2010 – 2019
- 2019
- [c29]Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev:
Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection. ETS 2019: 1-6 - 2017
- [j8]Mehdi Sadi
, Sukeshwar Kannan, LeRoy Winemberg, Mark M. Tehranipoor:
SoC Speed Binning Using Machine Learning and On-Chip Slack Sensors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(5): 842-854 (2017) - [j7]Xiaoxiao Wang
TRO: An On-Chip Ring Oscillator-Based GHz Transient IR-Drop Monitor. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(5): 855-868 (2017) - [j6]Miao Tony He
Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications. IEEE Trans. Very Large Scale Integr. Syst. 25(9): 2602-2615 (2017) - [j5]Mehdi Sadi
Design of Reliable SoCs With BIST Hardware and Machine Learning. IEEE Trans. Very Large Scale Integr. Syst. 25(11): 3237-3250 (2017) - [c28]Jae Woong Jeong, Ender Yilmaz, LeRoy Winemberg, Sule Ozev:
Built-in self-test for stability measurement of low dropout regulator. ITC 2017: 1-9 - [c27]Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg:
Some considerations on choosing an outlier method for automotive product lines. ITC 2017: 1-10 - [c26]Mehmet Ince, Ender Yilmaz, Jae Woong Jeong, LeRoy Winemberg, Sule Ozev:
Evaluation of loop transfer function based dynamic testing of LDOs. ITC-Asia 2017: 14-19 - [c25]Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg:
Learning the process for correlation analysis. VTS 2017: 1-6 - 2016
- [j4]Xiaoxiao Wang, Dongrong Zhang, Donglin Su, LeRoy Winemberg, Mark M. Tehranipoor:
A Novel Peak Power Supply Noise Measurement and Adaptation System for Integrated Circuits. IEEE Trans. Very Large Scale Integr. Syst. 24(5): 1715-1727 (2016) - [c24]Liting Yu, Xiaoxiao Wang, Yuanqing Cheng, Xiaoying Zhao, Pengyuan Jiao, Aixin Chen, Donglin Su, LeRoy Winemberg, Mehdi Sadi, Mark M. Tehranipoor:
An efficient all-digital IR-Drop Alarmer for DVFS-based SoC. ISCAS 2016: 221-224 - [c23]Mehdi Sadi, Gustavo K. Contreras, Dat Tran, Jifeng Chen, LeRoy Winemberg, Mark M. Tehranipoor:
BIST-RM: BIST-assisted reliability management of SoCs using on-chip clock sweeping and machine learning. ITC 2016: 1-10 - [c22]Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak:
Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture. ITC 2016: 1-10 - [c21]Miao Tony He, Gustavo K. Contreras, Mark M. Tehranipoor, Dat Tran, LeRoy Winemberg:
Test-point insertion efficiency analysis for LBIST applications. VTS 2016: 1-6 - 2015
- [j3]Xiaoxiao Wang, LeRoy Winemberg, Donglin Su, Dat Tran, Saji George, Nisar Ahmed, Steve Palosh, Allan Dobin, Mark M. Tehranipoor:
Aging Adaption in Integrated Circuits Using a Novel Built-In Sensor. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(1): 109-121 (2015) - [c20]Gustavo K. Contreras, Nisar Ahmed, LeRoy Winemberg, Mark M. Tehranipoor:
Predictive LBIST model and partial ATPG for seed extraction. DFTS 2015: 139-146 - [c19]Mehdi Sadi, Mark M. Tehranipoor, Xiaoxiao Wang, LeRoy Winemberg:
Speed Binning Using Machine Learning And On-chip Slack Sensors. ACM Great Lakes Symposium on VLSI 2015: 155-160 - [c18]Gustavo K. Contreras, Yang Zhao, Nisar Ahmed, LeRoy Winemberg, Mohammad Tehranipoor:
LBIST pattern reduction by learning ATPG test cube properties. ISQED 2015: 147-153 - [c17]Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang
Generalization of an outlier model into a "global" perspective. ITC 2015: 1-10 - [c16]Mehdi Sadi, LeRoy Winemberg, Mark M. Tehranipoor:
A robust digital sensor IP and sensor insertion flow for in-situ path timing slack monitoring in SoCs. VTS 2015: 1-6 - 2014
- [c15]Qihang Shi, Mohammad Tehranipoor, Xiaoxiao Wang, LeRoy Winemberg:
On-chip sensor selection for effective speed-binning. MWSCAS 2014: 1073-1076 - [c14]Jifeng Chen, LeRoy Winemberg, Mohammad Tehranipoor:
Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests. VTS 2014: 1-6 - 2013
- [j2]Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults. J. Electron. Test. 29(1): 35-48 (2013) - [c13]Ender Yilmaz, Geoff Shofner, LeRoy Winemberg, Sule Ozev:
Fault analysis and simulation of large scale industrial mixed-signal circuits. DATE 2013: 565-570 - 2012
- [j1]Xiaoxiao Wang, Mohammad Tehranipoor, Saji George, Dat Tran, LeRoy Winemberg:
Design and Analysis of a Delay Sensor Applicable to Process/Environmental Variations and Aging Measurements. IEEE Trans. Very Large Scale Integr. Syst. 20(8): 1405-1418 (2012) - [c12]Nik Sumikawa, Jeff Tikkanen, Li-C. Wang
Screening customer returns with multivariate test analysis. ITC 2012: 1-10 - [c11]Xiaoxiao Wang, Dat Tran, Saji George, LeRoy Winemberg, Nisar Ahmed, Steve Palosh, Allan Dobin, Mohammad Tehranipoor:
Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements. ITC 2012: 1-9 - 2011
- [c10]Shuo Wang, Mohammad Tehranipoor, LeRoy Winemberg:
In-field aging measurement and calibration for power-performance optimization. DAC 2011: 706-711 - [c9]Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir:
Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits. DATE 2011: 794-799 - [c8]Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty
Critical Fault-Based Pattern Generation for Screening SDDs. ETS 2011: 177-182 - [c7]Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang
Forward prediction based on wafer sort data - A case study. ITC 2011: 1-10 - [c6]Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang
Understanding customer returns from a test perspective. VTS 2011: 2-7 - [c5]Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor:
Case Study: Efficient SDD test generation for very large integrated circuits. VTS 2011: 78-83 - [c4]Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg:
Special session 5B: Panel How much toggle activity should we be testing with? VTS 2011: 114 - [c3]LeRoy Winemberg, Mohammad Tehranipoor:
Special session: Hot topic: Smart silicon. VTS 2011: 323 - 2010
- [c2]Dat Tran, LeRoy Winemberg, Darrell Carder, Xijiang Lin, Joe LeBritton, Bruce Swanson:
Detecting and diagnosing open defects. ITC 2010: 811
2000 – 2009
- 2005
- [c1]LeRoy Winemberg:
Outsourcing DFT: it can be done but it isn't easy. ITC 2005: 2
Coauthor Index
aka: Mohammad Tehranipoor
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