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M. T. Lin

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2000 – 2009

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2008
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M. H. Lin, M. T. Lin, Tahui Wang:
Effects of length scaling on electromigration in dual-damascene copper interconnects. Microelectron. Reliab. 48(4): 569-577 (2008)

1980 – 1989

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1989
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M. T. Lin, I. Chen, J. Lao:
ESUDL: an expert system for monitoring unclassified data link (UDL) communication systems protocols. IEA/AIE (1) 1989: 46-53

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