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AITest 2020: Oxford, UK
- IEEE International Conference On Artificial Intelligence Testing, AITest 2020, Oxford, UK, August 3-6, 2020. IEEE 2020, ISBN 978-1-7281-6984-2
- Hsien-I Lin
, Po-Yi Lin:
An Image Quality Assessment Method for Surface Defect Inspection. 1-6 - Paolo Arcaini
Dealing with Robustness of Convolutional Neural Networks for Image Classification. 7-14 - Taejoon Byun, Abhishek Vijayakumar, Sanjai Rayadurgam, Darren D. Cofer:
Manifold-based Test Generation for Image Classifiers. 15-22 - Zaid Tahir, Rob Alexander:
Coverage based testing for V&V and Safety Assurance of Self-driving Autonomous Vehicles: A Systematic Literature Review. 23-30 - Greg Chance, Abanoub Ghobrial
An Agency-Directed Approach to Test Generation for Simulation-based Autonomous Vehicle Verification. 31-38 - Dhasarathy Parthasarathy, Karl Bäckström, Jens Henriksson, Sólrún Einarsdóttir:
Controlled time series generation for automotive software-in-the-loop testing using GANs. 39-46 - Diogo Moreira, Ana Paula Furtado, Sidney C. Nogueira:
Testing acoustic scene classifiers using Metamorphic Relations. 47-54 - Chaojin Wang, Jian Shen, Chunrong Fang
Accuracy Measurement of Deep Neural Network Accelerator via Metamorphic Testing. 55-61 - Dilip J. Hiremath, Martin Claus
Automated identification of metamorphic test scenarios for an ocean-modeling application. 62-63 - Hong Zhu, Ian Bayley, Dongmei Liu, Xiaoyu Zheng:
Automation of Datamorphic Testing. 64-72 - Deepak Talwar, Sachin Guruswamy, Naveen Ravipati, Magdalini Eirinaki
Evaluating Validity of Synthetic Data in Perception Tasks for Autonomous Vehicles. 73-80 - Cristian Augusto
Test-Driven Anonymization in Health Data: A Case Study on Assistive Reproduction. 81-82 - Mark Utting
Identifying and Generating Missing Tests using Machine Learning on Execution Traces. 83-90 - Sergey Pavlov, Anna Gromova, Iosif Itkin, Murad Mamedov, Alexander Libkov, Andrey Novikov, Evgenii Tsymbalov:
Building a Classification System for Failed Test Reports: Industrial Experience. 91-98 - Cristina Landing, Sahar Tahvili, Hugo Haggren, Martin Längkvist, Auwn Muhammad, Amy Loutfi:
Cluster-Based Parallel Testing Using Semantic Analysis. 99-106 - Neil Walkinshaw
Improving Automated GUI Testing by Learning to Avoid Infeasible Tests. 107-114 - Josip Bozic, Yihao Li, Franz Wotawa
Ontology-driven Security Testing of Web Applications. 115-122 - Dusica Marijan, Arnaud Gotlieb, Abhijeet Sapkota:
Neural Network Classification for Improving Continuous Regression Testing. 123-124 - Henri Trenquier, Fuyuki Ishikawa, Susumu Tokumoto:
Attribute-based Granular Evaluation for Performance of Machine Learning Models. 125-132 - Jaganmohan Chandrasekaran, Huadong Feng, Yu Lei, Raghu Kacker, D. Richard Kuhn:
Effectiveness of dataset reduction in testing machine learning algorithms. 133-140
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