Low energy electron induced DNA damage: effects of terminal phosphate and base moieties on the distribution of damage. (Q53036480)
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scientific article published on 4 April 2008
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Low energy electron induced DNA damage: effects of terminal phosphate and base moieties on the distribution of damage. |
scientific article published on 4 April 2008 |
Statements
Low energy electron induced DNA damage: effects of terminal phosphate and base moieties on the distribution of damage (English)
Zejun Li
Yi Zheng
Pierre Cloutier