An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy (Q33576686)
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English | An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy |
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An assessment of the resolution limitation due to radiation-damage in x-ray diffraction microscopy (English)
M R Howells
T Beetz
C Cui
J M Holton
J Kirz
E Lima
S Marchesini
H Miao
D Sayre
D A Shapiro
J C H Spence
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